Outreach

Courses/Workshops

Special Event

Advances in (S)TEM workshop

Planned Events

These activities are/have been supported by the Canada Foundation for Innovation, under the MSI Program and by the Ministry of Research and Innovation of Ontario

 

Advanced In-Situ Electron Microscopy

Description:
A half-day workshop jointly organised by the NSERC APC Networks CaRPE-FC and LIB to discuss recent developments and advances in in-situ electron microscopy methods applied to the characterization of nanomaterials and to probe electrochemical processes and degradation of battery materials. The aim is to learn about novel methods of low-dose imaging of beam sensitive materials, limits of the techniques and provide insights into potential artefacts of the methods.

Date: Tuesday May 10, 2016, 1:30 pm

To download the information brochure, click here.

To register, click here.

Keynote Speakers:
Nigel Browning, Pacific Northwest National Laboratory
"Imaging Dynamic Processes in Liquids by Aberration Corrected (Scanning/Dynamic) Transmission Electron Microscopy"

Layla Mehdi, Pacific Northwest National Laboratory "Understanding the fundamental processes in Li-ion batteries by in-situ liquid ElectroChemical-STEM"

 

CCEM Summer School on Electron Microscopy

Description:
A 5-Day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron tomography, ultimate physical limits (beam damage and resolution) and the use of aberration-corrected electron microscopes. The aim is to provide students advice in solving characterization problems with the help of experts. The course will include lectures given by experts in the use of the technique and experts in electron optics, alignment and optimization of electron microscopes and EELS spectrometers. Students will have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes with the experts from the microscope and spectrometer companies. Two FEI Titan microscopes with correctors and monochromators (Quantum and Tridiem spectrometers) will be used for training. Several hands-on data processing sessions are also organised.

Date: May 29 to June 3, 2016

To download the information brochure, click here.

To register, click here.

Aberration-corrected TEM, STEM
Alignment of microscopes with correctors
EELS data processing and MLLS fitting
Independent Component Analysis
Compressed sensing imaging
Electron tomography
Fundamental limits from beam damage
Inelastic scattering and ultimate resolution
Monochromated EELS, EELS mapping
Operation of monochromators
Optimization of spectroscopy data acquisition
Simulation of images and diffraction patterns
STEM quantitative image analysis

Instructors:
Various instructors from Academic Institutions and technical experts from manufacturers of microscopes, spectrometers and aberration correctors.



Past events

 

Advanced Microscopy and Spectroscopy of Metallic Alloys

Description:
The aims of this workshop is to present applications of state-of-the-art electron microscopy, atom probe tomography and spectroscopic techniques to study the detailed structure and composition of metallic alloys used in automotive, thermoelectric and shape-memory applications.

Date: June 26, 2015

Location:
Room 105
Materials Technology Laboratory
183 Longwood Rd. South,
Hamilton

To download the information brochure, click here.

Registration is now closed.

Materials Applications:

Mg and Al alloys
Thermoelectric Alloys
Shape-Memory Alloys
High-resolution analysis of corrosion of Mg alloys
Internal Oxidation
Detection of Carbon in Steels

Techniques:

High-resolution electron microscopy
3D-Atom Probe Tomography
Statistical analysis of spectroscopic data (SEM/TEM)
Phase identification with statistical methods
Electron Energy Loss Spectroscopy of alloys

 

Public Lecture - The world through a microscope - from Antonie van Leeuwenhoek to life at the nanoscale


click here to register

 

MSC-SMC Annual Meeting 2015
click here to download poster

 

CCEM School on Electron Microscopy

Description:
A 5-day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron tomography, ultimate physical limits (beam damage and resolution) and the use of aberration-corrected electron microscopes. The aim is to provide students advice in solving characterization problems with the help of experts. The course will include lectures given by experts in the use of the technique and experts in electron optics, alignment and optimization of electron microscopes and EELS spectrometers. Students will have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes with the experts from the microscope and spectrometer companies. Students are encouraged to bring their own TEM-ready samples. Two FEI Titan microscopes with correctors and monochromators (Quantum and Tridiem spectrometers) and one FEI Osiris with SuperEDX and a FS1 spectrometer will be used for training.

Date: June 1 to 5, 2015

To download the information brochure, click here.

Registration is now closed.

Aberration-corrected TEM, STEM
Alignment of microscopes with correctors
EELS data processing and MLLS fitting
Multivariate statistical analysis
Fundamental limits from beam damage
Inelastic scattering and ultimate resolution
Monochromated EELS, EELS mapping
Operation of monochromators
Optimization of spectroscopy data acquisition
Simulation of images and diffraction patterns
STEM quantitative image analysis

Instructors:
Various instructors from Academic Institutions and technical experts from manufacturers of microscopes, spectrometers and aberration correctors.



Advanced Electron Diffraction Methods for Materials Analysis

Description:
A two day workshop organised as a satellite meeting to the 23rd Congress of the International Union of Crystallography meeting. The event aims to introduce students to powerful electron diffraction methods in transmission electron microscopy that can be used to determine the structure of material, structural modulations in crystals, atomic displacements and charge density distributions. The format includes lectures in the morning and ample of time for discussions with instructors. A good background in crystallography and diffraction is required to register.

Date: August 14-15, 2014

To download the information brochure, click here.

Space group determination
Quantitative convergent beam electron diffraction
Coherent diffraction
Diffuse scattering and modulated structures
Structure determination
Precession techniques
Diffraction imaging
Diffraction of nanostructures

In-situ microscopy and spectroscopy techniques for electrochemical processes

Description:
A TWO DAYS WORKSHOP jointly organised by the NSERC APC networks CaRPE-FC and LIB to discuss advanced in-situ characterization techniques with X-rays, NMR and electron microscopy and their applications to study electrochemical processes in fuel cells, battery materials and electrodeposition. The aim is to promote network interactions and introduce participants to a variety of characterization techniques and new in-situ tools. The workshop will include demonstrations of advanced instruments on site.

Th practical component of the workshop is now closed due to the limited space. However, attendance and registration for the first day of the workshop, when all lectures will be given, is still possible until May 15.

Date: 22 and 23 May 2014

To download the information brochure, click here.

Registration is now closed.

 

Atom Probe Tomography (APT) Workshop

Description:
This workshop will be divided into 3 separate days. The first day, suited for both beginners and advanced users, will consist of seminars by both CAMECA's Engineers and local APT users to provide an insight into using APT to obtain three-dimensional subnanometer compositional information from materials. An introduction will be given on: operation modes, suitable materials, data reconstruction and analysis, and applications. The second day, open for up to 20 participants, will highlight what is required to obtain high quality APT data. Demonstrations on specimen preparation (both electropolishing and FIB) will be given, as well as hands-on use of IVAS (a data reconstruction and analysis software). On the last day, limited to 5 participants, a full experiment using APT will be conducted. An option will be given to do the experiment on one of the participant's specimens. This workshop will be delivered by CAMECA's engineers and CAMECA LEAP 4000XHR will be used for the training.

Date: June 9 to 11, 2014

To download the information brochure, click here.

For any inquiries please contact Mor Baram baramm@mcmcaster.ca

Introduction to Atom Probe Tomography
Applications of Atom Probe Tomography for various materials
Specimen preparation for Atom Probe Tomography
Operation of the Atom Probe
Optimization of Atom Probe data acquisition
Mass-to-charge spectrum analysis
Data reconstruction and calibration
Examples of data analysis: Clusters and precipitates analysis, proxigrams, iso-surfaces, composition profiles, etc.

 

CCEM School on Electron Microscopy

Description:
A 5-day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron tomography, ultimate physical limits (beam damage and resolution) and the use of aberration-corrected electron microscopes. The aim is to provide students advice in solving characterization problems with the help of experts. The course will include lectures given by experts in the use of the technique and experts in electron optics, alignment and optimization of electron microscopes and EELS spectrometers. Students will have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes with the experts from the microscope and spectrometer companies. Students are encouraged to bring their own TEM-ready samples. Two FEI Titan microscopes with correctors and monochromators (Quantum and Tridiem spectrometers) and one FEI Osiris with SuperEDX and a FS1 spectrometer will be used for training.

Date: June 2 to 6, 2014

To download the information brochure, click here.

To download the registration form, click here.

Aberration-corrected TEM, STEM
Alignment of microscopes with correctors
EELS data processing and MLLS fitting
Electron tomography
Fundamental limits from beam damage
Inelastic scattering and ultimate resolution
Monochromated EELS, EELS mapping
Operation of monochromators
Optimization of spectroscopy data acquisition
Simulation of images and diffraction patterns
Focal Series Reconstruction

Instructors:
Various instructors from Academic Institutions and technical experts from manufacturers of microscopes, spectrometers and aberration correctors.

The CCEM: 5 years of advanced microscopy

Description:
One day workshop to mark recent advances in electron microscopy techniques and to highlight some of the key results obtained at the Canadian Centre for Electron Microscopy in the past five years.
Date: 31 January 2014
Location: Gilmour Hall, Room 111,McMaster University, Hamilton, ON, Canada

Download the flyer

 

Advanced Characterization of Energy Conversion and Storage Materials

Description:
A one day workshop jointly organised by the NSERC APC networks CaRPE-FC and LIB to discuss and present advanced characterization techniques and their applications to study novel catalysts and membranes for fuel cells and novel battery materials. The aim is to promote network interactions and introduce participants to a variety of characterization techniques and demonstrate advances in instrumentation. The workshop will include demonstrations of advanced instruments on site at the Canadian Centre for Electron Microscopy.

Date: May 17, 2013

To download the information brochure, click here.

Scanning Transmission X-ray Microscopy of FC Membranes
Advances in high-resolution electron microscopy (TEM and SEM)
NMR techniques in fuel cells and battery materials studies
X-ray diffraction methods

Keynote Speaker:
Karren L. More, Oak-Ridge National Laboratory, USA

View the Program here


CCEM School on Electron Microscopy

Description:
A 5-day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron tomography, ultimate physical limits (beam damage and resolution) and the use of aberration-corrected electron microscopes. The aim is to provide students advice in solving characterization problems with the help of experts. The course will include lectures given by experts in the use of the technique and experts in electron optics, alignment and optimization of electron microscopes and EELS spectrometers. Students will have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes with the experts from the microscope and spectrometer companies. Students are encouraged to bring their own TEM-ready samples. Two FEI Titan microscopes with correctors and monochromators (Quantum and Tridiem spectrometers) and one FEI Osiris with SuperEDX and a FS1 spectrometer will be used for training.

Date: June 24 to 28, 2013

To download the information brochure, click here.

Aberration-corrected TEM, STEM
Alignment of microscopes with correctors
EELS data processing
Electron tomography
Fundamental limits from beam damage
Inelastic scattering and ultimate resolution
Monochromated EELS, EELS mapping
Operation of monochromators
Optimization of spectroscopy data acquisition

Instructors:
Various instructors from Academic Institutions and technical experts from manufacturers of microscopes, spectrometers and aberration correctors.

Aberration-Corrected Electron Microscopy

Description:
a 5-day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron holography and the use of aberration-corrected electron microscopes. The aim is to provide students advice in solving characterization problems with the help of experts. The course will include lectures given by experts in the use of the technique and experts in electron optics, alignment and optimization of electron microscopes. Students will have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes with the experts from the microscope companies. Students are encouraged to bring their own TEM-ready samples. Two FEI Titan microscopes with correctors and monochromators and one FEI Osiris with SuperEDX will be used for training.

Date: June 11 to 15, 2012

To download the information brochure, click here.

Topics:
Aberration-corrected TEM, STEM
Alignment of microscopes with correctors
Monochromated EELS, ELNES, EELS mapping
Operation of monochromators
Focal series reconstruction, image/diffraction simulations
Lorentz Microscopy and Electron Holography,New EDXS detectors

Instructors:
Several instructors from Academic Institutions and technical experts from manufacturers of microscopes and aberration correctors (FEI, CEOS and Gatan) (see the brochure for details)


Aberration-Corrected Electron Microscopy

A 5-day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron holography and the use of aberration-corrected electron microscopes. The aim is to provide students advice in solving characterization problems with the help of experts. The course will include lectures given by experts in the use of the technique and experts in electron optics, alignment and optimization of electron microscopes. Students will have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes with the experts from the microscope companies. Students are encouraged to bring their own TEM-ready samples. Two FEI Titan microscopes with correctors and monochromators and one FEI Osiris with SuperEDX will be used for training.

Date: June 13 to 17, 2011

To download the information brochure, click here.

Topics:
Aberration-corrected TEM, STEM
Alignment of microscopes with correctors
Monochromated EELS, ELNES, EELS mapping
Operation of monochromators
Focal series reconstruction, image/diffraction simulations
Electron Holography, New EDXS detectors

Instructors:
Several instructors from Academic Institutions and technical experts from manufacturers of microscopes and aberration correctors (FEI, CEOS and Gatan) (see the brochure for details)


Symposium on Cryo-electron Microscopy of Biological Specimens

This one-day symposium aims to cover advances in cryo-microscopy techniques in electron crystallography, single-particle approaches and cryo-electron tomography. The format includes keynote and invited talks and student presentation covering the above topics.

When: Thursday, December 9, 2010 9:30 a.m. - 5:00 p.m.
Location: Gilmour Hall Room 111, Council Chambers, McMaster University. Hamilton, ON
Organizers: Joaquin Ortega and Gianluigi Botton

Keynote Speaker:
  Derek Taylor, Department of Pharmacology
  Case Western Reserve University, Cleveland, OH
  Title: "The molecular mechanism of protein synthesis in eukaryotes"

Confirmed Invited Speakers:
  John Rubinstein (Hospital for Sick Children. Toronto)
  Cezar Khursigara (University of Guelph)
  Howard Young (University of Alberta)
  Martin Schmeing (University of McGill).

Includes demonstration of the of the high-throughput automated acquisition software (TOM2) in the FEI-Titan electron microscope.

To download the announcement click here.
Detailed program available.


Advances In Electron Microscopy

A one day event to inform the local community of the latest advances in electron microscopy imaging methods and related technology. Program will include a keynote speaker and several technical talks on developments by microscopes manufacturers. An ideal opportunity to learn the latest information on instrumentation, meet the manufacturers and network with other users from industry and universities in Southern Ontario.

Keynote Speaker:
David Joy, Oak-Ridge National Laboratory and University of Tennesee,
Title: 21st Century Scanning Microscopy - Electrons and Ions

Date: 5 November 2010, 10:00 to 16:30
Location: McMaster University, Gilmour Hall, Room 111.


Aberration-Corrected Microscopy

A 5 day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, and the use of aberration-corrected electron microscopes. The aim is to provide students experience in solving characterization problems with the help of experts . The course will includes lectures given by experts in the use of the technique and experts in the electron optics, alignment and optimization of electron microscopes. The students will have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes with the experts from the microscope companies. Students are encouraged to bring their own TEM-ready samples. Two FEI Titan microscopes with correctors and monochromators will be used for training. This course will be limited to 15 students.

Detailed information on the brochure attached.

Topics: Aberration-corrected TEM, STEM
Alignment of microscopes with correctors
Monochromated EELS, ELNES, EELS mapping
Operation of monochromators
Focal series reconstruction

Instructors
several instructors from Academic Institutions and technical experts from manufacturers of microscopes and aberration correctors (FEI, CEOS and Gatan)


Microscopy of Polymers
One day workshop on characterization of polymer structures with microscopy methods
To download the announcement, click here.
Annoucement
Program


Workshop on Cryomicroscopy of Biological Specimens
This one-day symposium aims to gather the growing regional community with an interest in structural biology and a specific focus on cryo-electron microscopy
Program


CCEM Summer School on Electron Microscopy
A 5-1/2 day course on Electron Microscopy for graduate students (PhD level) as a satellite to the Canadian Chemistry Conference and Exhibition. The course is aimed at students with some basic background in microscopy who would like to deepen their knowledge in advanced techniques and interpretation of transmission electron microscopy data. The program can be found below.
Announcement
Program

CCEM-Oxford Instruments EBSD workshop 4th November 2008


Opening of the CCEM 16th and 17th October 2008
16th October "Plaque Unveil Ceremonies"
17th October "Opening Conference"


2008 March 26th EMK/OCE Workshop on Nuclear Materials


2008 June 24th, Light Microscopy demonstrations, Olympus


2007 Canadian Materials Science Conference and Workshops
CMSC Pictures


2007 May (28-31) Course to industry, Magellan Aerospace four-day course covering Metallography, Fractography, SEM and EDS Analysis


2007 February 9th Cryomicroscopy Day


2005 Microscopical Society of Canada/Société de Microscopie du Canada annual meeting and related workshops on Materials Characterization at National Facilities.


2004 Symposium on Interfaces