11th Annual FIB SEM Workshop

11th Annual FIB SEM Workshop

Date: April 30 – May 2, 2018

Canadian Centre for Electron Microscopy (CCEM)
McMaster University
Hamilton, Ontario, Canada
The CCEM and the FIB SEM User Group are offering a three day workshop on the use of focused ion beam scanning electron microscopy (FIB SEM) techniques. The workshop will include an optional pre-meeting 1-day FIB tutorials, followed by user and vendor presentations/demos, best paper student awards and many networking opportunities with conference attendees and equipment vendors.

Please check www.fibsem.net for detailed agenda and travel information.  Contact nbassmic@mcmaster.ca if you have any questions about the workshop.

Registration for the workshop is free. Breakfast and lunch will be provided.

Tentative Agenda

Day 1: Pre-meeting FIB Tutorials (Optional, limited to 40 attendees)

  • Introduction to FIB instrumentation
  • Ion-solid interactions
  • Sample preparation Dos & Don’ts
  • 2D & 3D analysis
  • Lithography
  • Evening Mixer – McMaster University Club

Day 2: 11th annual FIB SEM Meeting

  • User and vendor presentations
  • Poster session
  • Evening social (transportation provided)

Day 3: 11th annual FIB SEM Meeting

  • User and vendor presentations
  • Demos

To register for this workshop please use the form below.

Are you attending the pre-meeting tutorial on April 30th (required)

Are you attending the pre-meeting mixer on April 30th (spots are limited)? (required)

Are you attending the evening social on May 1st? (required)

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