ccem No Comments

Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model

 

Christopher W. Schankula, Christopher K. Anand and Nabil D. Bassim*
*corresponding author: bassimn@mcmaster.ca

Microscopy and Microanalysis 2018, 24, 657-666