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FIB SEM Meeting

10th Annual FIB SEM Meeting
Thursday, March 2nd, 2017  
National Institute of Standards and Technology (NIST)
Gaithersburg, MD
 
It’s our 10th annual meeting!
The 2017 FIB SEM Workshop will be held at the National Institute of Standards and Technology (NIST).  As always, it will have a full day of technical content and plenty of opportunities for informal discussion with your fellow FIBers.
Please mark your calendar!
 
Organizers:
Nabil Bassim, bassimn@mcmaster.ca
Ken Livi, klivi@jhu.edu

 

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CCEM Summer School

The annual CCEM Summer School on Electron Microscopy will be June 5-9, 2017.

Confirmed Speakers:
R. Egerton (U. Alberta); P. Hartel (CEOS);
M. Hytch (CEMES, Toulouse) ; L. Jones (Oxford);
S. Lazar (FEI); P. Longo (Gatan); Q. Ramasse
(SuperSTEM, UK); D. Rossouw (McMaster);
E. Sourty (FEI); P. Stadelmann (EPFL);
P. Tiemeijer (FEI); R. Twesten (Gatan)