18th Annual FIB SEM Meeting
Apr 8, 2026 to Apr 9, 2026
9:00AM to 5:00PM
Date/Time
Date(s) - 08/04/2026 - 09/04/2026
9:00 am - 5:00 pm
The FIB SEM 2026 Meeting will be held at the Kossiakoff Center, APL/JHU, 11100 Johns Hopkins Road, Laurel, MD. We will have two full days of presentations, tutorials, and posters by FIB users and vendors, highlighting interesting new FIB applications and the latest technology. And, as always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow FIBers.
Abstract submissions are required for all presenters (user & vendor contributions). If you would like to present a paper or poster, please submit an abstract to the organizers. We are accepting abstracts on:
- Cryo-FIB SEM for biological and materials applications
- Correlative analysis & workflows
- 2D & 3D FIB SEM analysis for semiconductor, materials, and biological FIB applications
- Novel specimen preparation approaches
- Novel FIB instrumentation and analytical capabilities
- AI & ML for FIB
- Other FIB related topics
There is no fee to attend the meeting, and breakfast and lunch will be provided! And, as always, there will be a Happy Hour event Wednesday evening.
Continued this year will be student awards for best oral and poster presentation! Win up to $500 to cover travel for the meeting (eligible expenses include hotel, food, airfare, rental vehicle/mileage). Please indicate in the form below if you would like to be considered for an award.
Abstract Submission Deadline: March 1st, 2026
Abstracts should be 250 words or less in length. Please email your abstracts to fibsem2026@fibsem.net.