CCEM Summer School 2026
Jun 22, 2026 to Jun 26, 2026
9:00AM to 6:00PM
Date/Time
Date(s) - 22/06/2026 - 26/06/2026
9:00 am - 6:00 pm
SAVE THE DATE
Save the date for the Correlative Microscopy Summer School, a 5-day intensive for experienced users focused on end?to?end workflows linking X-ray computed tomography (XCT), focused ion beam (FIB), scanning electron microscopy (SEM), and atom probe tomography (APT). Participants will get expert guidance on experiment design, site-specific FIB-SEM preparation, instrument alignment, and cross-modal registration, with extensive hands-on time on all platforms. The course includes extensive hands-on training, where students will work directly with experts from microscope and detector manufacturers to align and operate various instruments, including but not limited to, CCEM’s ZEISS VersaXRM 730, TFS Helios 5 PFIB, TFS Apreo, and Cameca LEAP 5000 XS. In addition to practical instrument training, the course features lectures and demonstrations on advanced data acquisition strategies and cutting-edge techniques to enhance imaging, reconstructions, and data interpretation. Several hands-on data processing sessions are also integrated into the program, providing participants with practical experience in analyzing and interpreting results. This is a unique opportunity to refine skills, gain valuable insights, and collaborate with leading researchers in the field.
Date: June 23 – 27, 2025
Location: McMaster University
Cost: All meals and course notes are included in the registration fee ranging from $1700.CDN/full-time students to $3000.CDN/researchers. Accommodation will be separate and the responsibility of attendees
