Exciting Job Opportunity: Research Associate at CCEM (Focused Ion Beam)

We are hiring a full-time Research Associate with expertise in Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM). This role involves working with cutting-edge FIB-SEM systems, supporting a variety of research projects, and training users in advanced microscopy techniques.

Key responsibilities include sample preparation, 3D tomography, and combining FIB techniques with EBSD and EDS. Candidates with hands-on experience in FIB-SEM and a background in materials characterization are encouraged to apply. A degree in a related field is preferred, but equivalent experience is also valued.

If you are passionate about materials characterization and enjoy solving technical challenges, we encourage you to apply. For more details about the position and how to apply, visit our job postings page.

The position will remain open until filled.