Courses & Workshops
These activities are supported by the Canada Foundation for Innovation, under the MSI Program and by the Ministry of Research and Innovation of Ontario. A list of past events run by the CCEM can be found here.
Surface and Micro-Nanoscale Analysis: Solving Materials Characterization Problems in Industry
Date: Wednesday May 1, 2019
Location: Ivey Spencer Leadership Centre, 551 Windermere Rd, London, ON N5X 2T1
Time: 8:30 am – 5:00 pm
A one-day workshop, jointly hosted by Surface Science Western (SSW), Western University, the Canadian Centre for Electron Microscopy (CCEM), McMaster University, and the Canadian Light Source (CLS), Saskatoon, on an introduction to surface and microanalysis techniques, including how they work and what type of information can be obtained. Numerous industrial applications will be presented. Registration is free, all day coffee and food bar, gourmet buffet lunch.
A tour of Surface Science Western’s facilities showcasing their new set of state-of-the art equipment talked about by speakers during the workshop will also be available. Tours are approximately 1 hour (starting at 12:45 pm and ending at 2:00 pm) and busing to and from SSW will be provided. Please select this option in the registration form if interested.
See flyer and tentative program here.
2019 CCEM Summer School Application
Date: 3 to 7 June, 2019
Location: TBD, McMaster University, Hamilton, ON
Application deadline: January 31, 2019
This school will focus on advanced training with instructors and expert users of aberration-corrected microscopes, electron optics (correctors and microscopes) and spectrometers. The school will cover advanced EELS acquisition methods on the Quantum with K2 direct electron detector, Tridiem, monochromator alignments, advanced EELS data processing, advanced STEM image data processing, advanced data processing for electron tomography, energy-loss near-edge structures and atomic resolved EELS theory. Practical sessions will also cover processing of images and spectra using independent component analysis, HyperSpy and various tomography reconstruction softwares.
For more information see flyer here.
Registration is now full, please come back next year.