Past events run by the CCEM are listed below, by category, in reverse chronological order.
Advanced STEM Imaging
A one day workshop on advanced STEM imaging was held at McMaster University. Presentations were provided by Frédéric Pailloux (University of Poitiers) and Matthieu Bugnet (CNRS) with topics focused on advanced STEM image processing and in-situ electron microscopy, respectively.
Date: 9 February, 2018
Workshop on Focused Ion Beam Techniques
A half-day workshop on advanced FIB techniques was held in association with the 29th Canadian Materials Science Conference. The workshop was in Ottawa on the afternoon of Tuesday, June 20, 2017 and registration was done as part of registration for the conference. The workshop flyer with more information is available
Date: 20 June, 2017
Applications of Advanced Electron Microscopy Methods in Materials/Chemistry Research
A one-day workshop was held at McMaster University on Friday, June 2 2017. Eight international invited speakers presented work and discussed techniques related to liquid-cell in-situ microscopy, electron tomography and atomic-resolution imaging and analysis. The talks included some discussion of the background of each technique but the focus was on practical applications – when to use each technique, examples of problems that can be solved, limitations and future perspectives for materials analysis.
Date: 2 June, 2017
Workshop on Electron Tomography
The CCEM hosted an informal, in-depth, 2-day workshop on electron tomography on May 31 – June 1, 2017. There were lectures covering the theories and techniques of tomography and a series of hands-on demonstrations on collecting tomography data and using various software packages for alignment, reconstruction and visualization.
Dates: 31 May – 1 June, 2017
Advanced EELS Techniques
A full-day workshop focusing on advanced practices of EELS acquisition, imaging and analysis in a STEM microscope is offered by Gatan and Soquelec at the CCEM. Morning lectures will be followed by practical sessions on a Titan 80-300 HB STEM equipped with a Gatan Quantum EELS Spectrometer. Previous experience with electron microscopy and EELS is highly recommended. By the end of the day, participants can expect to know how to get the best out of their EELS spectrometer and how best to optimize experimental conditions to capture the maximum amount of information from their TEM specimen using EELS.
Date: November 3, 2016
Advanced In-Situ Electron Microscopy
A half-day workshop jointly organised by the NSERC APC Networks CaRPE-FC and LIB to discuss recent developments and advances in in-situ electron microscopy methods applied to the characterization of nanomaterials and to probe electrochemical processes and degradation of battery materials. The aim is to learn about novel methods of low-dose imaging of beam sensitive materials, limits of the techniques and provide insights into potential artefacts of the methods.
Date: May 10, 2016
The world through a microscope – from Antonie van Leeuwenhoek to life at the nanoscale
Date: May 27, 2015
Advanced Electron Diffraction Methods for Materials Analysis
A two-day workshop organised as a satellite meeting to the 23rd Congress of the International Union of Crystallography meeting. The event aims to introduce students to powerful electron diffraction methods in transmission electron microscopy that can be used to determine the structure of material, structural modulations in crystals, atomic displacements and charge density distributions. The format includes lectures in the morning and ample of time for discussions with instructors. A good background in crystallography and diffraction is required to register.
Date: August 14-15, 2014
In-situ microscopy and spectroscopy techniques for electrochemical processes
A two-day workshop jointly organised by the NSERC APC networks CaRPE-FC and LIB to discuss advanced in-situ characterization techniques with X-rays, NMR and electron microscopy and their applications to study electrochemical processes in fuel cells, battery materials and electrodeposition. The aim is to promote network interactions and introduce participants to a variety of characterization techniques and new in-situ tools. The workshop will include demonstrations of advanced instruments on site.
Date: May 22-23, 2014
Atom Probe Tomography (APT) Workshop
This workshop will be divided into 3 separate days. The first day, suited for both beginners and advanced users, will consist of seminars by both CAMECA’s Engineers and local APT users to provide an insight into using APT to obtain three-dimensional subnanometer compositional information from materials. An introduction will be given on: operation modes, suitable materials, data reconstruction and analysis, and applications. The second day, open for up to 20 participants, will highlight what is required to obtain high quality APT data. Demonstrations on specimen preparation (both electropolishing and FIB) will be given, as well as hands-on use of IVAS (a data reconstruction and analysis software). On the last day, limited to 5 participants, a full experiment using APT will be conducted. An option will be given to do the experiment on one of the participant’s specimens. This workshop will be delivered by CAMECA’s engineers and CAMECA LEAP 4000XHR will be used for the training.
Date: June 9-11, 2014
The CCEM: 5 years of advanced microscopy
A one-day workshop to mark recent advances in electron microscopy techniques and to highlight some of the key results obtained at the Canadian Centre for Electron Microscopy in the past five years.
Date: January 31, 2014
Advanced Characterization of Energy Conversion and Storage Materials
A one-day workshop jointly organised by the NSERC APC networks CaRPE-FC and LIB to discuss and present advanced characterization techniques and their applications to study novel catalysts and membranes for fuel cells and novel battery materials. The aim is to promote network interactions and introduce participants to a variety of characterization techniques and demonstrate advances in instrumentation. The workshop will include demonstrations of advanced instruments on site at the Canadian Centre for Electron Microscopy.
Date: May 17, 2013
Symposium on Cryo-electron Microscopy of Biological Specimens
This one-day symposium aims to cover advances in cryo-microscopy techniques in electron crystallography, single-particle approaches and cryo-electron tomography. The format includes keynote and invited talks and student presentation covering the above topics.
Date: December 9, 2010
Advances in Electron Microscopy
A one-day event to inform the local community of the latest advances in electron microscopy imaging methods and related technology. Program will include a keynote speaker and several technical talks on developments by microscopes manufacturers. An ideal opportunity to learn the latest information on instrumentation, meet the manufacturers and network with other users from industry and universities in Southern Ontario.
Date: November 5, 2010
Microscopy of Polymers
One-day workshop on characterization of polymer structures with microscopy methods.
Opening of the CCEM
Plaque Unveiling Ceremonies
Date: October 16, 2008
Date: October 17, 2008
EMK/OCE Workshop on Nuclear Materials
Date: March 26, 2008
Demonstrations of light microscopy by Olympus
Date: June 24, 2008
Industry Metallography Workshop
Magellan Aerospace four-day course covering metallography, fractography, SEM and EDS analysis.
Date: May 28-31, 2007
Date: February 9, 2007
Symposium on Interfaces
CCEM Summer Schools on Electron Microscopy
Every year since 2008 the CCEM has held a 5-day course for international users with experience in electron microscopy on the fundamentals of advanced electron microscopy. Topics include aberration corrected imaging, electron energy loss spectroscopy, electron tomography, ultimate physical limits (beam damage and resolution) and the use of aberration-corrected electron microscopes. The aim is to provide students advice in solving characterization problems with the help of experts. The course includes lectures given by invited experts in the use of the techniques from various international research labs and by experts in electron optics, alignment and optimization of electron microscopes and EELS spectrometers. The participants always have plenty of opportunities for hands-on training on the alignment and operation of the electron microscopes, under the guidance of experts from the microscope and spectrometer companies.
Participants in the 2017 Summer School on Electron Microscopy
Summer School on Electron Microscopy 2010
Summer School on Electron Microscopy 2009
Summer School on Electron Microscopy 2008
Advances in 3D Imaging Methods
A half-day workshop was held in association with the Microscopical Society of Canada meeting in May 2017 (Canadian Microscopy and Cytometry Symposium). The workshop was held on the morning of Friday, May 12 2017 at McGill University. Speakers from NIST, FEI, Tescan and McMaster University discussed the latest techniques in 3D imaging with electron microscopes.
Date: 12 May, 2017
Advanced Microscopy and Spectroscopy of Metallic Alloys
The aims of this workshop is to present applications of state-of-the-art electron microscopy, atom probe tomography and spectroscopic techniques to study the detailed structure and composition of metallic alloys used in automotive, thermo-electric and shape-memory applications.
Date: June 26, 2015
Location: Materials Technology Laboratory, Hamilton, Ontario
Workshop on Advances in (S)TEM
Workshop held partly as a tribute to Stephen Pennycook on the occasion of his 60th birthday.
Date: August 1-3, 2013
Location: Dancing Bear Lodge, Townsend, TN, USA