Microscopy Documents
One of the CCEM’s vision is to be a premier facility for training researchers. In order to help achieve this goal we have made training materials available online. Many are facility specific; however, general microscopy documents are also available.
Please email the facilities manager for password protected documents.
Click on the link to access each individual document.
Background Information
Image Analysis Software
Equipment Manuals
General
EBSD Info
JEOL 7000F
Magellan 400
TEM Williams and Carter
Basic
Expert
Chapter 3 – Elastic Scattering
Chapter 5 – Electron Sources
Chapter 7 – How to ‘See’ Electrons
Chapter 12 – Thinking in Reciprocal Space
Chapter 13 – Diffracted Beams
Chapter 16 – Diffraction from Crystals
Chapter 20 – Obtaining CBED Patterns
Chapter 24 – Thickness and Bending Effects
Chapter 25 – Planar Defects
Chapter 26 – Imaging Strain Fields
Chapter 40 – Fine Structure and Finer Details
Intermediate
Chapter 4 – Inelastic Scattering and Beam Damage
Chapter 11 – Diffraction in TEM
Chapter 18 – Obtaining and Indexing Parallel-Beam Diffraction Patterns
Chapter 19 – Kikuchi Diffraction
Chapter 23 – Phase-Contrast Images
Chapter 28 – High-Resolution TEM
Chapter 31 – Processing and Quantifying Images
Chapter 34 – Qualitative X-ray Analysis and Imaging
Chapter 36 – Spatial Resolution and Minimum Detection
Chapter 38 – Low-Loss and No-Loss Spectra and Images
Chapter 39 – High Energy-Loss Spectra and Images
Optional
Chapter 8 – Pumps and Holders
Chapter 10 – Specimen Preparation
Chapter 14 – Bloch Waves
Chapter 15 – Dispersion Surfaces
Chapter 17 – Diffraction from Small Volumes
Chapter 21 – Using Convergent-Beam Techniques
Chapter 27 – Weak-Beam Dark-Field Microscopy
Chapter 29 – Other Imaging Techniques
Chapter 30 – Image Simulation
Chapter 33 – X-ray Spectra and Images
Chapter 35 – Quantitative X-ray Analysis