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State-of-the-Art Research

We open a window between the worlds
of materials inspiration and realisation

Welcome to the Canadian Centre for Electron Microscopy

The Canadian Centre for Electron Microscopy provides world-class electron microscopy capabilities and expertise to Canadian researchers and industry working in a broad range of fields.
Learn more about the CCEM.

News & Updates

CCEM User Stories

Have you wondered how the work completed at the CCEM is used to solve everyday world-wide problems?

Take a look at our various user stories for a better understanding of how electron microscopy can be used to answer pressing questions concerning the environment, energy, our personal longevity, and more!

Gianluigi Botton takes on new directorship position with the Canadian Light Source

The Canadian Centre for Electron Microscopy would like to announce that Dr. Botton will be taking on the new directorship position with the Canadian Light Source. For the full story visit here.

Featured Paper: Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model

Microscopy and Microanalysis 2018, 24, 657-666

Christopher W. Schankula, Christopher K. Anand and Nabil D. Bassim*
*corresponding author: bassimn@mcmaster.ca

To have your paper featured, please submit all papers containing CCEM obtained data and analysis to Nano LIMS

For information on past news, see our news page.

Upcoming Events and Workshops

Check back for future events

Canadian Centre for Electron Microscopy joins Canadian FACT Network

The Canadian Centre for Electron Microscopy (CCEM) is pleased to announce that it is joining the Fabrication, Assembly, Characterization and Test (FACT) Network, a cooperative ecosystem of service-oriented labs offering expertise and services for fabrication, assembly, characterization, and test of micro-nanotechnologies. For the full story visit here.

Funding Partners

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