Welcome to the Canadian Centre for Electron Microscopy
The Canadian Centre for Electron Microscopy provides world-class electron microscopy capabilities and expertise to Canadian researchers and industry working in a broad range of fields.
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News & Updates
Special Seminar Announcement
In-situ Transmission Electron Microscopy on Monatomic Metallic Glasses Processing and Deformation Mechanism
Speaker: Scott X. Mao, Department of Mechanical and Materials Science, University of Pittsburgh, USA
Date: Tuesday, March 5, 2019
Time: 10 AM
Location: BSB B154
Professor Scott X. Mao is the William Kepler Whiteford Professor in the Department of Mechanical Engineering and Materials Science, University of Pittsburgh. He obtained his Ph.D in Tohuku University in 1988, and he worked at MIT and Harvard University as a post-doctor and visiting faculty. He was chair of the mechanical
behavior of materials committee in TMS/ASM and has received a number of research excellence awards from TMS and the Chancellor Award. Dr. Mao has published over 200 papers and given over one hundred invited talks in the areas of (1) monatomic metallic glass formation from pure metals through in situ ultrafast liquid quenching under TEM; (2) deformation/twinning, phase transformation processes under the in situ TEM; (3) in situ TEM on grain boundary mediated plasticity on nanocrystalline materials; (4) in situ electrochemical lithiation process in lithium-ion batteries including Nature, Science, Nature Materials. The total citation of Dr. Mao’s papers is 12,000 with H-index of 54. Currently he is editor of Advance in Metallurgical and Material Engineering, associate editor for Advances in Materials Research, guest editor for Material Science & Engineering International Journal.
For more information, see the seminar flyer.
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Featured Paper: Enhancing the Photoelectrochemical Response of DNA Biosensors Using Wrinkled Interfaces
ACS Appl. Mater. Interfaces 2018, 10, 37, 31178-31185
Sudip Saha, Yuting Chan, and Leyla Soleymani⁎
*Corresponding Author: firstname.lastname@example.org
For information on past news, see our news page.
Upcoming Events and Workshops
Surface and Micro-Nanoscale Analysis: Solving Materials Characterization Problems in Industry
2019 CCEM Summer School
Canadian Centre for Electron Microscopy joins Canadian FACT Network
The Canadian Centre for Electron Microscopy (CCEM) is pleased to announce that it is joining the Fabrication, Assembly, Characterization and Test (FACT) Network, a cooperative ecosystem of service-oriented labs offering expertise and services for fabrication, assembly, characterization, and test of micro-nanotechnologies. For the full story visit here.