Welcome to the Canadian Centre for Electron Microscopy
The Canadian Centre for Electron Microscopy provides world-class electron microscopy capabilities and expertise to Canadian researchers and industry working in a broad range of fields.
Learn more about the CCEM.
News & Updates
CCEM User Stories
Have you wondered how the work completed at the CCEM is used to solve everyday world-wide problems?
Take a look at our various user stories for a better understanding of how electron microscopy can be used to answer pressing questions concerning the environment, energy, our personal longevity, and more!
Gianluigi Botton takes on new directorship position with the Canadian Light Source
Featured Paper: Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model
Microscopy and Microanalysis 2018, 24, 657-666
Christopher W. Schankula, Christopher K. Anand and Nabil D. Bassim*
*corresponding author: firstname.lastname@example.org
For information on past news, see our news page.
Canadian Centre for Electron Microscopy joins Canadian FACT Network
The Canadian Centre for Electron Microscopy (CCEM) is pleased to announce that it is joining the Fabrication, Assembly, Characterization and Test (FACT) Network, a cooperative ecosystem of service-oriented labs offering expertise and services for fabrication, assembly, characterization, and test of micro-nanotechnologies. For the full story visit here.