Home-Slider-3

State-of-the-Art Research

We open a window between the worlds
of materials inspiration and realisation

Welcome to the Canadian Centre for Electron Microscopy

The Canadian Centre for Electron Microscopy provides world-class electron microscopy capabilities and expertise to Canadian researchers and industry working in a broad range of fields.
Learn more about the CCEM.

News & Updates

Special Seminar Announcement
In-situ Transmission Electron Microscopy on Monatomic Metallic Glasses Processing and Deformation Mechanism

Speaker: Scott X. Mao, Department of Mechanical and Materials Science, University of Pittsburgh, USA
Date: Tuesday, March 5, 2019
Time: 10 AM
Location: BSB B154

Professor Scott X. Mao is the William Kepler Whiteford Professor in the Department of Mechanical Engineering and Materials Science, University of Pittsburgh. He obtained his Ph.D in Tohuku University in 1988, and he worked at MIT and Harvard University as a post-doctor and visiting faculty. He was chair of the mechanical

behavior of materials committee in TMS/ASM and has received a number of research excellence awards from TMS and the Chancellor Award. Dr. Mao has published over 200 papers and given over one hundred invited talks in the areas of (1) monatomic metallic glass formation from pure metals through in situ ultrafast liquid quenching under TEM; (2) deformation/twinning, phase transformation processes under the in situ TEM; (3) in situ TEM on grain boundary mediated plasticity on nanocrystalline materials; (4) in situ electrochemical lithiation process in lithium-ion batteries including Nature, Science, Nature Materials. The total citation of Dr. Mao’s papers is 12,000 with H-index of 54. Currently he is editor of Advance in Metallurgical and Material Engineering, associate editor for Advances in Materials Research, guest editor for Material Science & Engineering International Journal.

For more information, see the seminar flyer.

The CCEM has merchandise!

Browse and buy merchandise here.

Featured Paper: Enhancing the Photoelectrochemical Response of DNA Biosensors Using Wrinkled Interfaces

ACS Appl. Mater. Interfaces 2018, 10, 37, 31178-31185

Sudip Saha, Yuting Chan, and Leyla Soleymani

*Corresponding Author: soleyml@mcmaster.ca

To have your paper featured, please submit all papers containing CCEM obtained data and analysis to Nano LIMS

For information on past news, see our news page.

Upcoming Events and Workshops

Surface and Micro-Nanoscale Analysis: Solving Materials Characterization Problems in Industry

Date: Wednesday May 1, 2019
Location: Ivey Spencer Leadership Centre, 551 Windermere Rd, London, ON N5X 2T1
Time: 8:30 am – 5:00 pm

For more information see flyer

Register here.

2019 CCEM Summer School

Date: 3 to 7 June, 2019
Location: TBD, McMaster University
Application deadline: January 31, 2019

For more information see flyer

Registration is now full, please come back next year.

Canadian Centre for Electron Microscopy joins Canadian FACT Network

The Canadian Centre for Electron Microscopy (CCEM) is pleased to announce that it is joining the Fabrication, Assembly, Characterization and Test (FACT) Network, a cooperative ecosystem of service-oriented labs offering expertise and services for fabrication, assembly, characterization, and test of micro-nanotechnologies. For the full story visit here.

Funding Partners

Top