Welcome to the Canadian Centre for Electron Microscopy
The Canadian Centre for Electron Microscopy provides world-class electron microscopy capabilities and expertise to Canadian researchers and industry working in a broad range of fields.
Learn more about the CCEM.
News & Updates
Gianluigi Botton takes on new directorship position with the Canadian Light Source
Public Lecture: Chemical origins of our solar system and ancient stars as viewed through atomic-scale studies of planetary materials
Speaker: Professor Thomas Zega, University of Arizona
Date: May 30, 2019 Time: 1:30 PM Location: BSB 147
Featured Paper: Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model
Microscopy and Microanalysis 2018, 24, 657-666
Christopher W. Schankula, Christopher K. Anand and Nabil D. Bassim*
*corresponding author: email@example.com
CCEM Art Gallery Competition Open
The annual art gallery competition is now open.
Look here for guidelines and submission details.
Submission deadline: April 26, 2019
The CCEM has merchandise!
Browse and buy merchandise here.
For information on past news, see our news page.
Upcoming Events and Workshops
Surface and Micro-Nanoscale Analysis: Solving Materials Characterization Problems in Industry
CCEM User Group Meeting and Scientific Workshop
2019 CCEM Summer School
Canadian Centre for Electron Microscopy joins Canadian FACT Network
The Canadian Centre for Electron Microscopy (CCEM) is pleased to announce that it is joining the Fabrication, Assembly, Characterization and Test (FACT) Network, a cooperative ecosystem of service-oriented labs offering expertise and services for fabrication, assembly, characterization, and test of micro-nanotechnologies. For the full story visit here.