Overview
CCEM has a compilation of training and theoretical training videos on both instrumentation and microscopy applications. The content is regularly updated with monthly webinars and workshop content. Check back for new videos and look through the archive to learn more about work happening at CCEM!
Scanning Electron Microscopy
Expandable List
- How to Start your SEM Session
- How to Insert a Sample into the SEM
- Introduction to SEM Sample Holders
- Parts of the SEM
- Components of the SEM Handset
- Turning on the HT and Adjusting the Working Distance in an SEM
- Adjusting the stage height and using the infrared chamberscope in an SEM
- Setting the kV and spot size in an SEM
- Acquiring higher resolution images in a conventional SEM
- Different picture modes in a JEOL SEM
- How to Save Images from the SEM
- Using Auto Functions on the SEM
- Steps to ending an SEM session
- Software functions on the JEOL 6610 LV
- BSE Modes on an SEM
Scanning Transmission/Transmission Electron Microscopy
Spectroscopy
Focused Ion Beam/Helium Ion Microscopy
Atom Probe Tomography
Sample Preparation
Applications
CCEM Webinars
- Capabilities of the FHS Facility
- Strain Mapping at CCEM
- In-situ SEM Tensile Testing Methodologies for Digital Image Correlation
- Using Room Temperature Ionic Liquids in Electron Microscopy Imaging Applications
- Imagining Blood and Clot Interactions on Material Surfaces with SEM
- Characterizing interfacial Segregation by APT and Auger
Image Processing
Expandable List
- Introduction to Image Processing and Optimization
- Image Processing for Electron Microscopy
- EM Data Management and Processing in the Age of Big Data
- Image Processing is not What you Want to do Toward Automatic Image Analysis
- Basics to Image Processing
- HyperSpy
- Dragonfly Segmentation wizard – Deep learning made easy
- Image Processing drop in session and PCA