Scanning Electron Microscopy
Expandable List
- How to Start your SEM Session
- How to Insert a Sample into the SEM
- Introduction to SEM Sample Holders
- Parts of the SEM
- Components of the SEM Handset
- Turning on the HT and Adjusting the Working Distance in an SEM
- Adjusting the stage height and using the infrared chamberscope in an SEM
- Setting the kV and spot size in an SEM
- Acquiring higher resolution images in a conventional SEM
- Different picture modes in a JEOL SEM
- How to Save Images from the SEM
- Using Auto Functions on the SEM
- Steps to ending an SEM session
- Software functions on the JEOL 6610 LV
- BSE Modes on an SEM
Scanning Transmission/Transmission Electron Microscopy
CCEM Webinars
- Transmission Electron Microscopy Basics
- Scanning Transmission Electron Microscopy: Introduction and Imaging Modes
- Introduction to EELS
- Introduction to Low-Loss EELS
- Introduction to Liquid Cell Electron Microscopy
- Monochromated STEM-EELS: The Titan’s Wien Filter
- Image Corrector
- Advancing your TEM analysis with TFS Spectra Ultra
Spectroscopy
Focused Ion Beam/Helium Ion Microscopy
Atom Probe Tomography
Sample Preparation
Applications
CCEM Webinars
- Capabilities of the FHS Facility
- Strain Mapping at CCEM
- In-situ SEM Tensile Testing Methodologies for Digital Image Correlation
- Using Room Temperature Ionic Liquids in Electron Microscopy Imaging Applications
- Imagining Blood and Clot Interactions on Material Surfaces with SEM
- Characterizing interfacial Segregation by APT and Auger
Image Processing
Expandable List
- Introduction to Image Processing and Optimization
- Image Processing for Electron Microscopy
- EM Data Management and Processing in the Age of Big Data
- Image Processing is not What you Want to do Toward Automatic Image Analysis
- Basics to Image Processing
- HyperSpy
- Dragonfly Segmentation wizard – Deep learning made easy
- Image Processing drop in session and PCA