Cameca LEAP 5000 XS
Description:
- The Local Electrode Atom Probe (LEAP) 5000 XS from CAMECA Instruments Inc. is a high-resolution material analysis system that provides quantitative three-dimensional elemental and isotopic mapping with sub-nanometre resolution.
Features:
- Wide field-of-view and improved ion optics for high-quality spatial resolutions
- New detector technologies for unmatched multi-hit detection capabilities and detection efficiencies
- Laser capabilities using an ultraviolet laser (355 nm wavelength) for expanded material range
- Large range of pulse repetition rates for fast data acquisition times
- Vacuum and Cryo Transfer Module (VCTM) enables analysis of cryogenic and/or air sensitive materials
Field-evaporation of ions for material examination
- Reconstruction of collected data to yield a 3D computer model of the material
- Live-time mass-spectrum calibration and 3D data reconstruction for improved data quality
- Equipped with CAMECA AP Suite 6 software for easy and efficient data analysis
Applications:
- Characterization of dopants in semiconductors
- Analysis of alloying elements in steels
- Trace element segregation to interfaces and clusters
- Isotope ratio measurements in minerals
- Generation of 1D concentration profiles and 2D maps with atomic sensitivity
Contact: Gabe Arcuri for more information.
