JEOL JAMP-9500F FE-Auger
Description:
- The JEOL JAMP-9500F FE-Auger is a high-sensitivity instrument for surface analysis.
- It offers very high spatial resolution with a minimum probe diameter of 8nm and high energy resolution.
Features:
- Hemispherical electrostatic energy analyzer with a large acceptance angle
- Multi-channel detector for element detection with concentrations as low as 0.2 atomic%
- Incorporation of SEM for sample imaging
- EDXS detector for quick preview analysis and precise location selection
- In-situ ion gun for selective milling and depth profiling
- Detection of elements with concentrations as low as 0.2 atomic%
- Depth profiling to a depth of a few hundred nanometers
- Removal of contamination and neutralization of surface charging for non-conductive samples using the ion gun
Applications:
- Surface analysis with high sensitivity and spatial resolution
- Depth profiling for material characterization
- Contamination removal and surface charge neutralization for non-conductive samples
Contact: Travis Casagrande for more information.
