3D Correlative Workflows and Applications: Characterization from X-rays to Electrons Workshop

Date/Time
Date(s) - 06/03/2023 - 07/03/2023
9:00 am - 6:00 pm

CCEM/Zeiss/Fibics Partnership Grand Opening!

A TWO-DAY WORKSHOP to kick-off a partnership and collaboration with Carl Zeiss, Fibics, and CCEM! The workshop will focus on the current state and innovations in correlative workflows from X-ray microscope (XRM) to focused ion beam and electron microscopy. World-class scientists have been invited to present their work, discuss applications of correlative workflows ranging from biological materials to semiconductors, and potentially set the future paths for characterization in 3D space. The talks are in topics ranging from state-of-the-art characterization tools including Zeiss’ next-gen XRM system, detailed applications using correlative workflows to understand materials from the micron to the nano-scale, and live demos on new instrumentation! The workshop is scheduled as a hybrid event with international invited speakers attending in-person, but attendees who wish to participate online are still welcome to attend.

See full program here.

Invited Speakers include:

Lamya Abdellaoui, Zeiss
Hrishikesh Bale, Zeiss
Ben Britton, University of British Columbia
Nikhilesh Chawla, Purdue University
Richard Johnston, Swansea University
Peter Lee, University College London
Mike Phaneuf, Fibics
Andras Vladar, NIST
Alyssa Williams, McMaster University

Poster abstracts

All abstracts can be found here: https://ccem.mcmaster.ca/app/uploads/2023/03/3D-Correlative-Workshop-Poster-Abstracts.pdf

Register here

Please note that in-person registration is now closed. Online registration will remain open until the end of the event.