Description:

• The Local Electrode Atom Probe (LEAP) 5000 XS from CAMECA Instruments Inc. is a high-resolution material analysis system that provides quantitative three-dimensional elemental and isotopic mapping with sub-nanometre resolution.

Features:

• Wide field-of-view and improved ion optics for high-quality spatial resolutions
• New detector technologies for unmatched multi-hit detection capabilities and detection efficiencies
• Laser capabilities using an ultraviolet laser (355 nm wavelength) for expanded material range
• Large range of pulse repetition rates for fast data acquisition times
• Vacuum and Cryo Transfer Module (VCTM) enables analysis of cryogenic and/or air sensitive materials

  Field-evaporation of ions for material examination

• Reconstruction of collected data to yield a 3D computer model of the material
• Live-time mass-spectrum calibration and 3D data reconstruction for improved data quality
• Equipped with CAMECA AP Suite 6 software for easy and efficient data analysis

Applications:

• Characterization of dopants in semiconductors
• Analysis of alloying elements in steels
• Trace element segregation to interfaces and clusters
• Isotope ratio measurements in minerals
• Generation of 1D concentration profiles and 2D maps with atomic sensitivity

Contact: Gabe Arcuri for more information.