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Scanning Electron Microscopes

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Description:

  • The Apreo 2 S LoVac is a FEG-SEM with high resolution performance on a wide range of materials using both high and low vacuum.

Features:

  • Standard Everhart Thornley electron detector along with a Trinity Detection System
  • Operation modes include standard, Optiplan and immersion
  • Equipped with drift compensated frame integration
  • Beam deceleration can be used to enhance and modify imaging
  • Electron channeling contrast imaging (ECCI) module
  • Backscattered electron detector with CBS and ABS modes
  • Oxford Instruments Ultimax 170 mm EDS
  • Oxford Instrument Symmetry 3 EBSD

Applications:

  • Collecting information on the sample composition, morphology, and surface features
  • EBSD for electron crystallography

Contact: Chris Butcher for more information.

Description:

  • The FEI Magellan 400 is an extreme high-resolution SEM with sub-nanometer resolution.
  • Operates at 1 to 30keV.

Features:

  • In-situ plasma cleaner and a liquid nitrogen cold finger for analyzing highly labile and sensitive materials.
  • SEM analysis of non-conductive materials at low beam energies.
  • High collection efficiency in-lens detector and a unique low voltage, high contrast solid state detector.
  • Two-mode objective lens with beam deceleration and immersion capabilities.

Applications:

  • High surface sensitivity, high resolution, and enhanced contrast at low voltages.

Contact: Chris Butcher for more information.

Description:

  • The Thermo Scientific Quattro ESEM is an environmental SEM allowing for the study of materials in various conditions.

Features:

  • Supports cooling and heating experiments in high vacuum and low vacuum.
  • Chamber size allows for various in-situ experiments.
  • Elemental information obtained with Thermo Scientific ChemiSEM Technology.
  • Various detectors including ETD, low-vacuum SED (LVD), gaseous SED for ESEM mode (GSED), and IR camera.
  • Live quantitative SEM image coloring based on energy-dispersive X-ray spectroscopy (EDS).
  • Stage bias (beam deceleration): -4000 V to +50 V.
  • Low vacuum mode: Up to 2600 Pa (H2O) or 4000 Pa (N2).

Applications:

  • Imaging materials in a range of conditions.
  • Elemental mapping with SEM software.

Contact: Jhoynner Martinez for more information.

Jeol 6610 SEM sitting next to two monitors and control panel.Description:

  • The JEOL 6610LV is a tungsten filament equipped SEM with selectable low vacuum mode.

Features:

  • Large chamber enabling observation of specimens up to 200mm in diameter.
  • Resolution of 3.0nm at 30keV.

Applications:

  • Viewing secondary electron and backscattered composition images simultaneously.
  • EDS analysis.

Contact: Jhoynner Martinez for more information.

Tescan SEM sitting on the left of a desk with two monitors and the operating unit sitting to the right.Description:

  • The TESCAN VEGA-II LSU SEM is a variable pressure SEM equipped with a tungsten filament.

Features:

  • Conductive samples viewed via high vacuum mode, non-conductive samples under low vacuum conditions.
  • Stage holds 7 stubs (13mm diameter) at one time and allows for 360-degree rotation and 50-degree tilt.
  • Peltier cooling stage available.
  • SE and BSE imaging done simultaneously.
  • Equipped with an X-MAX 80mm2 EDS detector and INCA software.

Contact: Marcia Reid for more information.