Join us for a dynamic TWO-DAY WORKSHOP hosted by CCEM in partnership with Protochips Inc, where we delve into the cutting-edge realm of in-situ/operando microscopy and its latest innovations. This event boasts a stellar lineup of international speakers, ready to showcase their groundbreaking work and explore the applications of in-situ microscopy and spectroscopy in advanced materials characterization. For more information, see the full program here.
List of keynote and invited speakers include:
Qian Chen, University of Illinois at Urbana-Champaign
Kathryn Grandfield, McMaster University
Sarah Haigh, University of Manchester
Adam Hitchcock, McMaster University
Jane Howe, University of Toronto
Robert Klie, University of Illinois at Chicago
Yao Yang, Cornell University
Haimei Zheng, Lawrence Berkeley National Laboratory
Secure your spot for the in-person experience by registering before April 18, 2024. Online registration will remain open throughout the workshop for your convenience.