Summer School 2025
Jun 23, 2025 to Jun 27, 2025
9:00AM to 5:00PM
Date/Time
Date(s) - 23/06/2025 - 27/06/2025
9:00 am - 5:00 pm
This 5-day intensive course is designed for users with experience in electron microscopy who want to deepen their understanding of aberration-corrected electron microscopy and advanced detector technologies. Participants will receive expert guidance on solving complex characterization challenges, with lectures from specialists in electron optics, microscope alignment, and EELS spectrometry. The course includes extensive hands-on training, where students will work directly with experts from microscope and spectrometer manufacturers to align and operate CCEM’s TFS Spectra Ultra, Nion HERMES, and TFS Talos F200X. In addition to practical instrument training, the course features lectures and demonstrations on advanced data acquisition strategies and cutting-edge techniques to enhance imaging, spectroscopy, and data interpretation. Several hands-on data processing sessions are also integrated into the program, providing participants with practical experience in analyzing and interpreting results. This is a unique opportunity to refine skills, gain valuable insights, and collaborate with leading researchers in the field.
For more information on instructors and topics, see flyer here.
Date: June 23 – 27, 2025
Location: McMaster University
Cost: All meals and course notes are included in the registration fee ranging from $1700.CDN/full-time students to $3000.CDN/researchers. Accommodation will be separate and the responsibility of attendees
Registration
Register using the form below. A support email from supervisors will also be expected before the end of registration. Support letters can be sent to ccem@mcmaster.ca.
Registration closes: March 4, 2025